International Journal on Science and Technology

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Structural, Morphological and Compositional Analysis of WS2 thin films

Author(s) Chetan R. Yewale, Rajendra V. Wagh, Vaishali T. Salunke, Arun V. Patil, Satish S. Mandawade
Country India
Abstract Tungsten disulfide (WS₂) thin films were prepared using a sol–gel-assisted spin-coating technique for structural, morphological, and compositional investigation. Tungsten- and sulfur-based precursors were used to prepare the precursor solution, which was deposited on the substrate at 1000 rpm for 60 s. The deposited films were subjected to thermal treatment at 400 °C for 3 h in a closed muffle furnace. The structural characteristics of the prepared WS₂ thin films were investigated using X-ray diffraction (XRD), while surface morphology and elemental composition were examined using scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDX) respectively. XRD analysis confirmed the crystalline nature of the deposited film, with the observed diffraction features corresponding to the WS₂ crystalline phase. The crystallite size calculated using the Debye–Scherrer equation was 90.91 nm. SEM analysis revealed a rough, granular, and porous surface morphology comprising nanoscale grains with intergranular voids and localized agglomeration. EDX analysis confirmed the presence of tungsten and sulfur along with oxygen. The combined structural, morphological and compositional results establish the characteristics of the prepared WS₂ thin-film system and provide a basis for its investigation in surface-dependent electronic and sensing applications.
Keywords WS₂ thin films; sol–gel; spin coating; crystallite size; surface morphology; tungsten disulfide.
Published In Volume 17, Issue 3, July-September 2026
Published On 2026-09-19
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Crossref DOI prefix of IJSAT is 10.71097/IJSAT

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