RTL-Native Scandump Verification Strategies for First-Pass Silicon Success in High-Volume SoCs

Sashaank Kasturirangan

doi:10.71097/IJSAT.v17.i2.11468

RTL-Native Scandump Verification Strategies for First-Pass Silicon Success in High-Volume SoCs

Author(s)	Sashaank Kasturirangan
Country	United States
Abstract	The scaling of System-on-Chip (SoC) architectures to multi-billion transistors has introduced systemic bottlenecks in traditional Design-for-Test (DFT) verification methodologies. As gate-level simulation (GLS) becomes computationally prohibitive and time intensive due to long serial shift cycles and complex functional boot sequences, the semiconductor industry is pivoting towards a "shift-left" strategy. This paper presents an exhaustive technical framework for RTL-native scandump verification, a methodology that leverages the Verilog Procedural Interface (VPI) and Perl-driven design parsing to enable high efficiency RTL verification months before a synthesized gate netlist is available. By replacing slow, serial gate-level processes with a C-based backdoor randomization and state manipulation environment, this approach facilitates a 70-80% reduction in turnaround time in GLS verification. The analysis explores the integration of these techniques within high-volume production environments typical of leaders like AMD, Nvidia, and Qualcomm, highlighting the mitigation of tapeout risks. Furthermore, the discussion extends to the burgeoning challenges of 3D-IC architectures, the implementation of the IEEE 1838 standard, and the role of agentic AI in automating coverage closure for next-generation DFT structures.
Keywords	Design-for-Test (DFT), RTL-Native Verification, Scandump, Verilog Procedural Interface (VPI), Shift-Left, SoC Silicon Debug, IEEE 1838, Backdoor Randomization
Field	Engineering
Published In	Volume 17, Issue 2, April-June 2026
Published On	2026-06-02
DOI	https://doi.org/10.71097/IJSAT.v17.i2.11468

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RTL-Native Scandump Verification Strategies for First-Pass Silicon Success in High-Volume SoCs

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